COHERENCE SCANNING INTERFEROMETRY
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InterferometryInterferometry is a technique which uses the interference of superimposed waves to extract information. Interferometry typically uses electromagnetic waves and is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy (and its applications to chemistry), quantum mechanics, nuclear and particle physics, plasma physics, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, optometry, and making holograms.: 1–2 Interferometers are devices that extract information from interference. They are widely used in science and industry for the measurement of microscopic displacements, refractive index changes and surface irregularities. In the case with most interferometers, light from a single source is split into two beams that travel in different optical paths, which are then combined again to produce interference; two incoherent sources can also be made to interfere under some circumstances. The resulting interference fringes give information about the difference in optical path lengths. In analytical science, interferometers are used to measure lengths and the shape of optical components with nanometer precision; they are the highest-precision length measuring instruments in existence. In Fourier transform spectroscopy they are used to analyze light containing features of absorption or emission associated with a substance or mixture. An astronomical interferometer consists of two or more separate telescopes that combine their signals, offering a resolution equivalent to that of a telescope of diameter equal to the largest separation between its individual elements.
In connection with: Interferometry
Description combos: in fiber waves that of for their source interference
Optical coherence tomographyOptical coherence tomography (OCT) is a high-resolution imaging technique with most of its applications in medicine and biology. OCT uses coherent near-infrared light to obtain micrometer-level depth resolved images of biological tissue or other scattering media. It uses interferometry techniques to detect the amplitude and time-of-flight of reflected light. OCT uses transverse sample scanning of the light beam to obtain two- and three-dimensional images. Short-coherence-length light can be obtained using a superluminescent diode (SLD) with a broad spectral bandwidth or a broadly tunable laser with narrow linewidth. The first demonstration of OCT imaging (in vitro) was published by a team from MIT and Harvard Medical School in a 1991 article in the journal Science. The article introduced the term "OCT" to credit its derivation from optical coherence-domain reflectometry, in which the axial resolution is based on temporal coherence. The first demonstrations of in vivo OCT imaging quickly followed. The first US patents on OCT by the MIT/Harvard group described a time-domain OCT (TD-OCT) system. These patents were licensed by Zeiss and formed the basis of the first generations of OCT products until 2006. In the decade preceding the invention of OCT, interferometry with short-coherence-length light had been investigated for a variety of applications. The potential to use interferometry for imaging was proposed, and measurement of retinal elevation profile and thickness had been demonstrated. The initial commercial clinical OCT systems were based on point-scanning TD-OCT technology, which primarily produced cross-sectional images due to the speed limitation (tens to thousands of axial scans per second). Fourier-domain OCT became available clinically 2006, enabling much greater image acquisition rate (tens of thousands to hundreds of thousands axial scans per second) without sacrificing signal strength. The higher speed allowed for three-dimensional imaging, which can be visualized in both en face and cross-sectional views. Novel contrasts such as angiography, elastography, and optoretinography also became possible by detecting signal change over time. Over the past three decades, the speed of commercial clinical OCT systems has increased more than 1000-fold, doubling every three years and rivaling Moore's law of computer chip performance. Development of parallel image acquisition approaches such as line-field and full-field technology may allow the performance improvement trend to continue. OCT is most widely used in ophthalmology, in which it has transformed the diagnosis and monitoring of retinal diseases, optic nerve diseases, and corneal diseases. It has greatly improved the management of the top three causes of blindness – macular degeneration, diabetic retinopathy, and glaucoma – thereby preventing vision loss in many patients. By 2016 OCT was estimated to be used in more than 30 million imaging procedures per year worldwide. Intravascular OCT imaging is used in the intravascular evaluation of coronary artery plaques and to guide stent placement. Beyond ophthalmology and cardiology, applications are also developing in other medical specialties such as dermatology, gastroenterology, neurology and neurovascular imaging, oncology, and dentistry.
In connection with: Optical coherence tomography
Title combos: coherence Optical tomography coherence Optical
Description combos: Science coherence and Harvard available hundreds to rate law
Surface metrologySurface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures. Surface finish may be measured in two ways: contact and non-contact methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers. Non-contact methods include: interferometry, digital holography, confocal microscopy, focus variation, structured light, electrical capacitance, electron microscopy, photogrammetry and non-contact profilometers.
In connection with: Surface metrology
Title combos: metrology Surface
Description combos: It the and Surface must instruments electron internal microscopy
ISO 25178ISO 25178: Geometrical Product Specifications (GPS) – Surface texture: areal is an International Organization for Standardization collection of international standards relating to the analysis of 3D areal surface texture.
In connection with: ISO 25178
Title combos: 25178 ISO
Description combos: 25178 Specifications analysis international surface Product international for International
White light scannerA white light scanner (WLS) is a device for performing surface height measurements of an object using coherence scanning interferometry (CSI) with spectrally-broadband, "white light" illumination. Different configurations of scanning interferometer may be used to measure macroscopic objects with surface profiles measuring in the centimeter range, to microscopic objects with surface profiles measuring in the micrometer range. For large-scale non-interferometric measurement systems, see structured-light 3D scanner.
In connection with: White light scanner
Title combos: White light White light scanner
Description combos: WLS be scanning surface with device objects illumination is
White light interferometryAs described here, white light interferometry is a non-contact optical method for surface height measurement on 3D structures with surface profiles varying between tens of nanometers and a few centimeters. It is often used as an alternative name for coherence scanning interferometry in the context of areal surface topography instrumentation that relies on spectrally-broadband, visible-wavelength light (white light).
In connection with: White light interferometry
Title combos: interferometry White interferometry light White
Description combos: nanometers measurement surface measurement white few surface interferometry scanning
Coherence scanning interferometryCoherence scanning interferometry (CSI) is any of a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure, and optical properties. CSI is currently the most common interference microscopy technique for areal surface topography measurement. The term "CSI" was adopted by the International Organization for Standardization (ISO). The technique encompasses but is not limited to instruments that use spectrally broadband, visible sources (white light) to achieve interference fringe localization. CSI uses either fringe localization alone or in combination with interference fringe phase, depending on the surface type, desired surface topography repeatability and software capabilities. The table below compiles alternative terms that conform at least in part to the above definition.
In connection with: Coherence scanning interferometry
Title combos: interferometry Coherence scanning Coherence interferometry
Description combos: film use the The white was with software in
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